Probe Cobra
Due to the recent rapid development of semiconductor processing and design technology, the operating frequency and integration of semiconductor wafers have increased dramatically. The Pad shape of a device generally used in the non-memory field has an irregular 2D arrangement. One of the probe shapes that can respond to this element is the vertical probe card
The cobra needle is the core component used in the vertical probe card and uses a high-density vertical insertion method.
Material: P7, BC
Specifications are customized according to customer needs
Customized production can be made according to customer drawings and samples
Stable quality and fast delivery
Country of origin: South Korea, the United States
Due to the recent rapid development of semiconductor processing and design technology, the operating frequency and integration level of semiconductor wafers have increased dramatically. Generally, the pad shapes of devices used in the non-storage field have an irregular two-dimensional arrangement. One form of probe that can respond to this element is the vertical view of the probe
The cobra needle is the main component used in the vertical probe map and uses a high-density vertical insertion method.
Material: P7, BC
Specifications are customized according to customer needs
Customized production can be made according to customer drawings and samples
Stable quality and fast delivery
Country of origin: South Korea, the United States
Due to the recent rapid development of semiconductor processing technology and design, the operating frequency and integration level of semiconductor wafers have been significantly increased. Generally, the cushion shape of equipment used in non-storage rooms has an unusual two-dimensional arrangement. One form of probe that can respond to this element is the vertical view of the probe.
The cobra needle is the main component used in the vertical probe map and uses a high-density vertical penetration method.
Material: P7, BC
Specifications are customized according to customer needs
Customized production can be made according to customer drawings and samples
Stable quality and fast delivery
Country of origin: South Korea, the United States
Recent rapid developments in semiconductor processing technology and design have significantly improved the operating frequency and integration level of semiconductor wafers. Generally, the cushion shape of equipment used in non-storage rooms has an unusual two-dimensional arrangement. One form of probe that can respond to this element is a vertical view of the probe.
Cobra needles are the main component used in vertical probe maps and use a high density vertical penetration method.
Material: P7, BC
Specifications are customized according to customer needs
Customized production can be made according to customer drawings and samples
Stable quality and fast delivery
Country of origin: South Korea, the United States